Dieter W. Pohl, Peter F. Meier
Physical Review Letters
Scanning near-field optical microscopy (SNOM) is an optical microscopy whose resolution is not bound to the diffraction limit. It provides chemical information based upon spectral, polarization and/or fluorescence contrast images. Details as small as 20 nm can be recognized. Photophysical and photochemical effects can be studied with SNOM on a similar scale. This article reviews a good deal of the experimental and theoretical work on SNOM in Switzerland. * Correspondence: Dr. D.W. Pohl a).
Dieter W. Pohl, Peter F. Meier
Physical Review Letters
Thomas F. McNelly, Dieter W. Pohl
Physical Review Letters
Dieter W. Pohl
Physical Review Letters
Winfried Denk, Dieter W. Pohl
Applied Physics Letters