William J. Kozlovsky, William P. Risk
IEEE JQE
No abstract available.
William J. Kozlovsky, William P. Risk
IEEE JQE
C.D. Nabors, R.C. Eckardt, et al.
Optics Letters
Gurinder P. Singh, Mike Suk, et al.
Journal of Tribology
Heinz Jaeckel, Gian-Luca Bona, et al.
IEEE JQE