P.M. Grant, M. Krounbi
Solid State Communications
We report polarized reflectivity measurements on crystalline (SN)x in the range of 0.25-6.0 eV. Our analysis of the data gives ωp=4.6 eV and m*=2me,, values considerably different from those previously reported by other workers. The data also suggest that (SN)x has sufficient electronic dimensionality to suppress a Peierls distortion. © 1975 The American Physical Society.
P.M. Grant, M. Krounbi
Solid State Communications
A. Nazzal, G.B. Street
Journal of the Chemical Society, Chemical Communications
J.C. Scott, P. Pfluger, et al.
Physical Review B
M. Nechtschein, F. Devreux, et al.
Physical Review Letters