P.S. Hauge
Proceedings of SPIE 1989
The optical properties of ultrathin (2-7 nm) oxide layers grown on Pb films have been measured by spectroscopic ellipsometry over the 1.4-5.4-eV photon energy range. The shape of the dielectric function resembles published measurements made on much thicker evaporated layers of orthorhombic PbO, but with the absorption edge shifted downward in energy by about 0.6 eV. The band gap in our case is estimated to be 2.8 eV from the theory of direct allowed transitions.
P.S. Hauge
Proceedings of SPIE 1989
Ellen J. Yoffa, P.S. Hauge
DAC 1984
E.P. Harris, W.H. Chang
IEEE Transactions on Magnetics
P.S. Hauge
SPIE Industrial and Civil Applications of Infrared Technology 1977