B. Hecht, H. Bielefeldt, et al.
Physical Review Letters
Subwave length-resolution optical image recording is demonstrated by moving an extremely narrow aperture along a test object equipped with fine-line structures. Details of 25-nm size can be recognized using 488-nm radiation. The result indicates a resolving power of at least λ/20 which is to be compared with the values of λ/2.3 obtainable in conventional optical microscopy.
B. Hecht, H. Bielefeldt, et al.
Physical Review Letters
D. Pohl, R. Möller
Review of Scientific Instruments
D. Pohl, W. Denk, et al.
Proceedings of SPIE 1989
D. Pohl
Solid State Communications