C.-K. Hu, K.Y. Lee, et al.
JES
A mirror structure for reflective Si-based light valves was fabricated using chemical-mechanical polishing and a thin 150-nm Al(Cu)/Ti mirror to minimize hillock formation. The use of chemical-mechanical polishing planarization resulted in only a 1% loss in reflectivity from topography under the mirrors. The reflectivity for pixel sizes from 7.5 to 40 μm and 0.7- or 0.5-μm gaps were measured, and the performance of TN LC pixels with different sizes and inversion methods are reported.
C.-K. Hu, K.Y. Lee, et al.
JES
K.P. Rodbell, E.G. Colgan, et al.
MRS Spring Meeting 1994
J.P. Gambino, E.G. Colgan
Materials Chemistry and Physics
F.E. Doany, D. Grischkowsky
Applied Physics Letters