Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
Paper
Oxide-charge-induced impurity band in silicon inversion layers
Abstract
No abstract available.
Related
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
Gregory Czap, Kyungju Noh, et al.
APS Global Physics Summit 2025