Daniel M. Bikel, Vittorio Castelli
ACL 2008
No abstract available.
Daniel M. Bikel, Vittorio Castelli
ACL 2008
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Frank R. Libsch, S.C. Lien
IBM J. Res. Dev
Xiaozhu Kang, Hui Zhang, et al.
ICWS 2008