H. Liu, D. Bedau, et al.
J Magn Magn Mater
Patterning damage in narrow trackwidth spin-valve sensors was studied. The resistance of the sensors increased with the width, while the giant magnetoresistance (GMR) ratio decreased with decreasing width. It was found that sensors patterned using a focused Ar ion beam showed a similar but much greater effect.
H. Liu, D. Bedau, et al.
J Magn Magn Mater
J.A. Katine, Michael Ho, et al.
INTERMAG 2003
Yongho Sungtaek Ju, Wen Lee, et al.
Digests of the Intermag Conference
D. Bedau, H. Liu, et al.
DRC 2010