D. Bedau, H. Liu, et al.
Applied Physics Letters
Patterning damage in narrow trackwidth spin-valve sensors was studied. The resistance of the sensors increased with the width, while the giant magnetoresistance (GMR) ratio decreased with decreasing width. It was found that sensors patterned using a focused Ar ion beam showed a similar but much greater effect.
D. Bedau, H. Liu, et al.
Applied Physics Letters
C. Wang, Y.-T. Cui, et al.
Journal of Applied Physics
D. Bedau, H. Liu, et al.
DRC 2010
J.A. Katine, R.E. Fontana Jr., et al.
INTERMAG 2003