Michiel Sprik
Journal of Physics Condensed Matter
Light incident on a total internal reflection surface will tunnel through a submicrometre gap in the presence of a dielectric surface. This tunnelling phenomenon is used in the photon tunnelling microscope to image polyethylene single crystals, providing a topographical map of the single-crystal surface. Tunnelling increases exponentially with sample height and is quantified using video photometry of the grey-scale tunnelling image. © 1994.
Michiel Sprik
Journal of Physics Condensed Matter
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
J. Tersoff
Applied Surface Science