Yaping Zhou, Paul M. Harvey, et al.
IEEE Topical Meeting EPEPS 2007
Three-dimensional (3D) integration creates vast opportunities to improve performance and the level of integration in nanoelectronic systems. However, 3D integration presents many challenges for power delivery network design due to larger supply currents and longer power delivery paths compared to 2D systems. In this paper, an analytical physical model is derived to incorporate the impact of 3D-integration on power supply noise. The model has less than 4% error compared to SPICE simulations. Based on the model, design guidelines and opportunities for reducing power supply noise, such as inserting "decap" die and through-vias, are discussed in this paper. © 2007 IEEE.
Yaping Zhou, Paul M. Harvey, et al.
IEEE Topical Meeting EPEPS 2007
Zeki C. Seskir, Piotr Migdał, et al.
Opt. Eng.
Deepak Sekar, Calvin King, et al.
IITC 2008
A.J. Hesford, J.D. Morsey, et al.
IEEE Topical Meeting EPEPS 2007