Yield estimation via multi-cones
Rouwaida Kanj, Rajiv Joshi, et al.
DAC 2012
Power is emerging as the next grand challenge in integrated circuit design. Impact of increasing power consumption can be seen from handheld device all the way to design of high end server microprocessors. Total power consumption is increasingly governed by exponentially increasing leakage power in newer process technologies. Along with increase in power consumption, the industry is also facing growing issues with inherent environmental and process variatons. This growing variability has a tremendous impact on power and power variability. In this paper, we review various issues with power variability and its impact on design. © 2005 IEEE.
Rouwaida Kanj, Rajiv Joshi, et al.
DAC 2012
Rouwaida Kanj, Rajiv Joshi, et al.
VLSI Design
Rouwaida Kanj, Zhuo Li, et al.
ISQED 2008
Rouwaida Kanj, Rajiv V. Joshi, et al.
IEEE Trans Semicond Manuf