P.O. Jubert, R. Allenspach, et al.
Physical Review B - CMMP
Probing depth of threshold photoemission electron microscopy was discussed. Photon excitation energies of 5 eV were studied. The mechanism responsible for bulk sensitivity was also studied. It was found that the probing depth is of 16.2 nm.
P.O. Jubert, R. Allenspach, et al.
Physical Review B - CMMP
A. Vanhaverbeke, A. Bischof, et al.
Physical Review Letters
O. Fruchart, J.-C. Toussaint, et al.
Physical Review B - CMMP
G. Parschau, E. Kirsten, et al.
Physical Review B