Probing depth of threshold photoemission electron microscopy

G.K.L. Marx; P.O. Jubert; A. Bischof; R. Allenspach

doi:10.1063/1.1616651

Applied Physics Letters

Paper

30 Sep 2003

Probing depth of threshold photoemission electron microscopy

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Abstract

Probing depth of threshold photoemission electron microscopy was discussed. Photon excitation energies of 5 eV were studied. The mechanism responsible for bulk sensitivity was also studied. It was found that the probing depth is of 16.2 nm.

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Abstract

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