ReviewLimitations of silicon devices for quantum computingRobert W. KeyesJournal of Physics Condensed Matter
PaperSpecial Correspondence Effect of Randomness in the Distribution of Impurity Ions on FET Thresholds in Integrated ElectronicsRobert W. KeyesIEEE JSSC
PaperFerrimagnetic Resonance Linewidth in Dense Polycrystalline FerritesP.E. Seiden, J.G. GrunbergJournal of Applied Physics
