PaperPyrometric measurements of si, ge, and gaas wafers between 100°and 700°cF. Jona, H.R. WendtJournal of Applied Physics
PaperAtomic structure of Cu{0 0 1}c(2 × 2)-ClD. Westphal, A. Goldmann, et al.Solid State Communications
PaperSample holder for diffraction and other studies in ultrahigh vacuumF. Jona, H.R. WendtReview of Scientific Instruments
PaperEarly stages of oxidation of the Fe{001} surface: Atomic structure of the first monolayerK.O. Legg, F. Jona, et al.Physical Review B
