Randomness versus fault-tolerance

Alfred K. Wong, Antoinette F. Molless, et al.

SPIE Advanced Lithography 2000

Vladimir Yanovski, Israel A. Wagner, et al.

Ann. Math. Artif. Intell.

I.K. Pour, D.J. Krajnovich, et al.

SPIE Optical Materials for High Average Power Lasers 1992

Zhihua Xiong, Yixin Xu, et al.

International Journal of Modelling, Identification and Control