R.M. Feenstra, P. Mårtensson
Physical Review Letters
The structure of steps on cleaved silicon (111) surfaces is studied by scanning tunneling microscopy. Predominantly [21»1»] oriented steps are observed. Ordered regions of individual steps have unit periodicity along the step edge. A -bonded reconstruction of the step edge is deduced from the images. © 1987 The American Physical Society.
R.M. Feenstra, P. Mårtensson
Physical Review Letters
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