R.M. Feenstra, W.A. Thompson, et al.
Physical Review Letters
The structure of steps on cleaved silicon (111) surfaces is studied by scanning tunneling microscopy. Predominantly [21»1»] oriented steps are observed. Ordered regions of individual steps have unit periodicity along the step edge. A -bonded reconstruction of the step edge is deduced from the images. © 1987 The American Physical Society.
R.M. Feenstra, W.A. Thompson, et al.
Physical Review Letters
R.M. Feenstra, Joseph A. Stroscio
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
R.M. Feenstra, G. Meyer, et al.
Physical Review B - CMMP
J.L. Jordan-Sweet, P.M. Mooney, et al.
Journal of Applied Physics