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Isotropic treatment of EMF effects in advanced photomasks
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SPIE Photomask Technology + EUV Lithography 2009
We give a constant α > 0.294 and, for any ε > 0, an algorithm for multiplying anN×Nmatrix by anN×Nαmatrix with complexityO(N2 + ε). © 1997 Academic Press.
Jaione Tirapu Azpiroz, Alan E. Rosenbluth, et al.
SPIE Photomask Technology + EUV Lithography 2009
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SPIE Optical Science, Engineering, and Instrumentation 1998
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