Conference paper
SERVO PERFORMANCE OF ACTUATOR BEARING GREASES
Walter L. Prater, Garvin J. Stone, et al.
IMECE 1996
The microstructure and electrical resistance of sputter deposited copper thin films grown in an oxygen containing ion-beam sputtering atmosphere are discussed. For thicker films, there is a monotonic increase in resistivity while for films thinner than 5 nm, 6%-10% oxygen causes a minimum in film resistivity. Smoother films for these oxygen flow rate are shown by X-ray reflectivity measurements. The results of X-ray diffraction show that the oxygen doping causes the formation of cuprous oxide and a refinement of the copper grain size.
Walter L. Prater, Garvin J. Stone, et al.
IMECE 1996