Resonant inelastic soft X-ray scattering as a bandstructure probe: A primer

S. Eisebitt; J. Lüning; J.-E. Rubensson; W. Eberhardt

doi:10.1002/(SICI)1521-3951(199909)215:1&lt;803::AID-PSSB803&gt;3.0.CO;2-O

physica status solidi (b)

Paper

01 Jan 1999

Resonant inelastic soft X-ray scattering as a bandstructure probe: A primer

View publication

Abstract

We present an introduction to resonant inelastic soft X-ray scattering (RIXS) spectroscopy as a tool to obtain bandstructure information in broad band solids.

Paper

Theory of temperature-induced Mott transitions

Ellen J. Yoffa, David Adler

Physical Review B

Paper

Scanning tunneling microscopy and spectroscopy of thin metal films on the GaAs(110) surface

P. Martensson, R.M. Feenstra

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Paper

Interface kinetics and crystal growth under conditions of constant cooling rate. I. Constant diffusion coefficient

R. Ghez, J.S. Lew

Journal of Crystal Growth

Conference paper

X-ray lithography induced radiation effects in deep submicron CMOS devices

L.K. Wang, A. Acovic, et al.

MRS Spring Meeting 1993

View all publications

Abstract

Related

Theory of temperature-induced Mott transitions

Scanning tunneling microscopy and spectroscopy of thin metal films on the GaAs(110) surface

Interface kinetics and crystal growth under conditions of constant cooling rate. I. Constant diffusion coefficient

X-ray lithography induced radiation effects in deep submicron CMOS devices