Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
The study of self-testing and self-correcting programs leads to the search for robust characterizations of functions. Here the authors make this notion precise and show such a characterization for polynomials. From this characterization, the authors get the following applications. Simple and efficient self-testers for polynomial functions are constructed. The characterizations provide results in the area of coding theory by giving extremely fast and efficient error-detecting schemes for some well-known codes. This error-detection scheme plays a crucial role in subsequent results on the hardness of approximating some NP-optimization problems.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
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Theoretical Computer Science
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SPIE Advanced Lithography 2010
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Operations Research