PaperCharacteristics of the annealing kinetics of tin films deposited at 88°KJ.R. Priest, C. Chiou, et al.Journal of Applied Physics
PaperStress Anisotropy in Silicon Oxide FilmsJ.R. Priest, H.L. Caswell, et al.Journal of Applied Physics
PaperLow-temperature properties of evaporated lead filmsH.L. Caswell, J.R. Priest, et al.Journal of Applied Physics