G. Grinstein, J.F. Fernandez
Physical Review B
Paper
Roughening and lower critical dimension in the random-field ising model
Abstract
It is argued on the basis of a new interface model that the lower critical dimension of random-field Ising systems is two, in agreement with simple domain estimates. © 1982 The American Physical Society.
Related
G. Grinstein, D. Mukamel
Journal of Physics A: Mathematical and General
G. Grinstein, D.H. Lee
Physical Review Letters
G. Grinstein, John Toner
Physical Review Letters