Qing Li, Zhigang Deng, et al.
IEEE T-MI
Presented here is an overview of the present status and future prospects of scanning tunneling microscopy. Topics covered include the physical basis of the scanning tunneling microscope, its instrumentation aspects, and its use for structural and spectroscopic imagingon a scale which extends to atomic dimensions. Associated experimental and theoretical studies are reviewed, including several which suggest potential applicability of this new type of microscope to a relatively broad range of biological, chemical, and technological areas. © 2000 IBM.
Qing Li, Zhigang Deng, et al.
IEEE T-MI
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Alessandro Morari, Roberto Gioiosa, et al.
IPDPS 2011
Raghu Krishnapuram, Krishna Kummamuru
IFSA 2003