William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
A link between scanning tunneling microscopy (STM) and conventional transmission electron microscopy (TEM) has been established by applying STM on freeze-dried recA-DNA complexes coated with a conducting film. The direct observed three-dimensional topography reveals right-handed single-helix pitch and recA monomers without any averaging. The STM is also able to resolve structural, physical and chemical features of bare airdried recA-DNA complexes. © 1988 IOP Publishing Ltd.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
T.N. Morgan
Semiconductor Science and Technology
H. Rohrer, H. Thomas
Journal of Applied Physics