Characterization of line width variation
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
Given N instances (X1,t1),…,(XN,tN) of Subset Sum, the AND Subset Sum problem asks to determine whether all of these instances are yes-instances; that is, whether each set of integers Xi has a subset that sums up to the target integer ti. We prove that this problem cannot be solved in time O˜((N⋅tmax)1−ε), for tmax=maxiti and any ε>0, assuming the ∀∃ Strong Exponential Time Hypothesis (∀∃-SETH). We then use this result to exclude O˜(n+pmax⋅n1−ε)-time algorithms for several scheduling problems on n jobs with maximum processing time pmax, assuming ∀∃-SETH. These include classical problems such as 1||∑wjUj, the problem of minimizing the total weight of tardy jobs on a single machine, and P2||∑Uj, the problem of minimizing the number of tardy jobs on two identical parallel machines.
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
W.C. Tang, H. Rosen, et al.
SPIE Optics, Electro-Optics, and Laser Applications in Science and Engineering 1991
Juliann Opitz, Robert D. Allen, et al.
Microlithography 1998
Imran Nasim, Michael E. Henderson
Mathematics