John G. Long, Peter C. Searson, et al.
JES
No abstract available.
John G. Long, Peter C. Searson, et al.
JES
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Q.R. Huang, Ho-Cheol Kim, et al.
Macromolecules
C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials