Conference paper
Symbolic implication in test generation
Sandip Kundu, I. Nair, et al.
European Conference on Design Automation 1992
In this paper we propose a new self-checking comparator with one periodic output. The comparator can be used as a two-rail checker or as an equality checker. Two different input patterns are sufficient to detect all the faults considered. ©1996 IEEE.
Sandip Kundu, I. Nair, et al.
European Conference on Design Automation 1992
Sandip Kundu
ISIT 1990
R. Thomas, Sandip Kundu
European Conference on Design Automation 1992
A. Devgan, Sandip Kundu
ASP-DAC 1998