Satoshi Oida, Fenton R. McFeely, et al.
Physical Review B - CMMP
Scanning tunneling microscopy has been used to determine the atomic structure of the clean Si(001) surface. The basic structural unit of the reconstruction has been resolved with a lateral resolution of 1/4 3. Buckled and nonbuckled dimers appear to be present in roughly equal amounts, indicating that they have nearly the same energy. The presence of atomic-scale defects is discussed. © 1985 The American Physical Society.
Satoshi Oida, Fenton R. McFeely, et al.
Physical Review B - CMMP
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
T. Hashizume, R.J. Hamers, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
O.L. Alerhand, A. Nihat Berker, et al.
Physical Review Letters