G. Bussetti, B. Bonanni, et al.
Physical Review Letters
An atomic force microscope capable of measuring, simultaneously yet separately, lateral ("frictional") and normal forces is described. A direction-dependent feature, absent in topological images, is found when scanning stepped surfaces of NaCl (001) in ultrahigh vacuum. A simple model is presented to account for this observation.
G. Bussetti, B. Bonanni, et al.
Physical Review Letters
Bert Voigtländer, Gerhard Meyer, et al.
Physical Review B
Bruno Schuler, Yunlong Zhang, et al.
Chemical Science
Jascha Repp, Gerhard Meyer, et al.
Science