Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
We show, for the first time, that the near edge structure of the crystalline silicon L2, 3 edge in absorption spectroscopy at an energy resolution of 0.3 eV can be largely explained without invoking many-body effects, or core excitons. Previous attempts to compare experimental results with total density of final states, without matrix element weighting, have lead to erroneous interpretations. © 1990.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
R. Ghez, J.S. Lew
Journal of Crystal Growth
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry