Conference paper
TEST GENERATION FOR FET SWITCHING CIRCUITS.
J.P. Roth, Vojin G. Oklobdzija, et al.
IEEE ITC 1983
A detailed account is given of the application of a minimization program to several design problems. Specifically these applications are concerned with the design of a curve function generator for a mass spectrometer for a proposed Mars probe and the design of autonomous shift registers with linear and nonlinear feedback, used for classification of binary sequences and counting tasks for spacecraft scientific data processing. Copyright © 1969 by The Institute of Electrical and Electronics Engineers, Inc.
J.P. Roth, Vojin G. Oklobdzija, et al.
IEEE ITC 1983
J.P. Roth
Pecora 1983
J.P. Roth
National Computer Conference AFIPS 1965