M.A. Lutz, R.M. Feenstra, et al.
Surface Science
The critical current density of single-, bi-, and polycrystalline Y1Ba2Cu3O7 films has been imaged by low Temperature Scanning Electron Microscopy (LTSEM) with a spatial resolution of 1/μ. Our experiments directly show that grain boundaries limit the critical current density in polycrystalline films. Substantial variatoons of the critical current density have also been found in high quality, c-axis oriented epitaxial films, which have critical current densities above 1×106A/cm2 at 77K. © 1989.
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
T. Schneider, E. Stoll
Physical Review B
David B. Mitzi
Journal of Materials Chemistry