Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry
The critical current density of single-, bi-, and polycrystalline Y1Ba2Cu3O7 films has been imaged by low Temperature Scanning Electron Microscopy (LTSEM) with a spatial resolution of 1/μ. Our experiments directly show that grain boundaries limit the critical current density in polycrystalline films. Substantial variatoons of the critical current density have also been found in high quality, c-axis oriented epitaxial films, which have critical current densities above 1×106A/cm2 at 77K. © 1989.
Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics