L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
The author discusses the use of the scanning tunnelling microscope as a spectroscopic tool. Several methods of obtaining spectroscopic information are reviewed. The strengths and weaknesses of scanning tunnelling microscopy are discussed in comparison with more conventional surface spectroscopy techniques.
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
John G. Long, Peter C. Searson, et al.
JES