Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
The author discusses the use of the scanning tunnelling microscope as a spectroscopic tool. Several methods of obtaining spectroscopic information are reviewed. The strengths and weaknesses of scanning tunnelling microscopy are discussed in comparison with more conventional surface spectroscopy techniques.
T.N. Morgan
Semiconductor Science and Technology
Shaoning Yao, Wei-Tsu Tseng, et al.
ADMETA 2011
Julien Autebert, Aditya Kashyap, et al.
Langmuir
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films