Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997
On Labor Day weekend, the highway patrol sets up spot-checks at random points on the freeways with the intention of deterring a large fraction of motorists from driving incorrectly. We explore a very similar idea in the context of program checking to ascertain with minimal overhead that a program output is reasonably correct. Our model of spot-checking requires that the spot-checker must run asymptotically much faster than the combined length of the input and output. We then show that the spot-checking model can be applied to problems in a wide range of areas, including problems regarding graphs, sets, and algebra. In particular, we present spot-checkers for sorting, convex hull, element distinctness, set containment, set equality, total orders, and correctness of group and field operations. All of our spot-checkers are very simple to state and rely on testing that the input and/or output have certain simple properties that depend on very few bits. Our results also give property tests as defined by Rubinfeld and Sudan (1996, SIAM J. Comput. 25, 252-271), Rubinfeld (1994, 'Proc. 35th Foundations of Computer Science,' pp. 288-299), and Goldreich et al. (1998, J. Assoc. Comput. Mach. 45, 653-750).
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997
J.P. Locquet, J. Perret, et al.
SPIE Optical Science, Engineering, and Instrumentation 1998
W.C. Tang, H. Rosen, et al.
SPIE Optics, Electro-Optics, and Laser Applications in Science and Engineering 1991
Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011