Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
The morphologies of single height atomic steps were studied on Si(001) samples with a miscut of ∼0°-0.05°using dark-field low-energy electron microscopy. In addition to the previously observed wavy step phase we identify a ''hilly'' phase at miscut angles <0.03°. This phase exhibits steps in excess of those required by the local miscut, but their morphology is qualitatively different from the straight steps predicted by theory. © 1993 The American Physical Society.
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials
A. Krol, C.J. Sher, et al.
Surface Science
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997