John G. Long, Peter C. Searson, et al.
JES
No abstract available.
John G. Long, Peter C. Searson, et al.
JES
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering