Hiroshi Ito, Reinhold Schwalm
JES
Paper
Strain relaxation mechanisms of thin deposited films
Abstract
No abstract available.
Related
P.C. Pattnaik, D.M. Newns
Physical Review B
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting