Robert W. Keyes
Physical Review B
The morphology and structure of sputtered Ta/Co/Ta thin-film sandwiches were investigated by cross-sectional high-resolution transmission electron microscopy. Although the Co layer shows an overall 〈111〉-oriented fcc structure, a high density of hcp stacking faults in present in the layer. The Co structure can thus be described as a random distribution of hcp stacking sequences in an overall fcc structure. © 1995.
Robert W. Keyes
Physical Review B
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
J.A. Barker, D. Henderson, et al.
Molecular Physics
R. Ghez, J.S. Lew
Journal of Crystal Growth