S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
The morphology and structure of sputtered Ta/Co/Ta thin-film sandwiches were investigated by cross-sectional high-resolution transmission electron microscopy. Although the Co layer shows an overall 〈111〉-oriented fcc structure, a high density of hcp stacking faults in present in the layer. The Co structure can thus be described as a random distribution of hcp stacking sequences in an overall fcc structure. © 1995.
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
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EMC 2001
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Micro and Nano Engineering
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