Skip to main content
Research
Focus areas
Blog
Publications
Careers
About
Back
Focus areas
Semiconductors
Artificial Intelligence
Quantum Computing
Hybrid Cloud
Back
About
Overview
Labs
People
Back
Semiconductors
Back
Artificial Intelligence
Back
Quantum Computing
Back
Hybrid Cloud
Back
Overview
Back
Labs
Back
People
Research
Focus areas
Semiconductors
Artificial Intelligence
Quantum Computing
Hybrid Cloud
Blog
Publications
Careers
About
Overview
Labs
People
Open IBM search field
Close
Microscopy and Microanalysis
Paper
01 Nov 2002
Sub-angstrom probe size in HADF-STEM at 120KV
Download paper
Abstract
No abstract available.
Related
Paper
Progress in aberration-corrected scanning transmission electron microscopy
Paper
Sub-aångstrom resolution using aberration corrected electron optics
Paper
Sub-aångstrom resolution using aberration corrected electron optics
Paper
Effects of detector black level in ADF-STEM imaging
View all publications