Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Paper

01 Jan 1988

Summary Abstract: Structure analysis of the GaAs(110) surface by scanning tunneling microscopy

View publication

Abstract

No abstract available.

Conference paper

Anomalous interface degradation of a-Si:H TFTs during LCD lifetime

Frank R. Libsch, Takatoshi Tsujimura

Active Matrix Liquid Crystal Displays Technology and Applications 1997

Conference paper

NEW RELIABLE STRUCTURE FOR HIGH TEMPERATURE MEASUREMENT OF SILICON WAFERS USING A SPECIALLY ATTACHED THERMOCOUPLE.

S. Cohen, T.O. Sedgwick, et al.

MRS Proceedings 1983

Paper

Scanning tunneling microscopy and spectroscopy of thin metal films on the GaAs(110) surface

P. Martensson, R.M. Feenstra

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Paper

Charge-to-spin current conversion efficiency in a spin-harvesting structure with spin-current loading and finite conductance

J.Z. Sun

Journal of Applied Physics

View all publications