I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
A home-built Kelvin force microscope combined with a spectroscopic method is dedicated to local measurements of topography and contact potential differences (CPD). This technique is based on a simple modification of a noncontact atomic force microscopy (nc-AFM), where a bias voltage is applied between the sample and tip during the CPD measurement. The changes in CPD between the tip and various sample materials have been measured. Kelvin force spectra of Pd/Si and of self-assembling monolayer films (SAMs) are presented. © 1998 Springer-Verlag.
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
Imran Nasim, Melanie Weber
SCML 2024
Peter J. Price
Surface Science
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures