Surface tension, roughening, and lower critical dimension in the random-field Ising model

Abstract

A continuum interface model is constructed to study the low-temperature properties of domain walls in the random-field Ising model (RFIM). The width of the domain wall and its surface tension are computed by three methods: Simple energy accounting, dimensional arguments, and approximate renormalization-group calculations. All methods yield a surface tension which is positive at sufficiently low temperature for small random fields, h, provided that the dimensionality d>2. The lower critical dimension of the RFIM is thus argued to be 2. While effects due to discreteness of a lattice are argued to alter some of the continuum results quantitatively, they do not change these central conclusions. For d<2 the ferromagnetic correlation length of the RFIM behaves like h-2(2-d)-1 as h0. © 1983 The American Physical Society.