Techniques for determining threshold

A.B. Fowler; A. Hartstein

doi:10.1016/0039-6028(80)90489-6

Surface Science

Paper

01 Jan 1980

Techniques for determining threshold

View publication

Abstract

Two techniques for determining threshold are compared to capatitance date. Errors from using 77 K thresholds are determined and the effect on measurements on NA+ doped samples estimated. © 1980, All rights reserved.

Paper

Persistent spectral hole burning in deuterated (formula presented)

R.M. Macfarlane, R.L. Cone

Physical Review B - CMMP

Conference paper

Modeling polarization for Hyper-NA lithography tools and masks

Kafai Lai, Alan E. Rosenbluth, et al.

SPIE Advanced Lithography 2007

Paper

Scanning tunneling microscopy and spectroscopy of thin metal films on the GaAs(110) surface

P. Martensson, R.M. Feenstra

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Paper

Electron and positron channeling radiation from beryllium oxide

H.D. Dulman, R.H. Pantell, et al.

Physical Review B

View all publications

Abstract

Related

Persistent spectral hole burning in deuterated (formula presented)

Modeling polarization for Hyper-NA lithography tools and masks

Scanning tunneling microscopy and spectroscopy of thin metal films on the GaAs(110) surface

Electron and positron channeling radiation from beryllium oxide