Robert E. Donovan
INTERSPEECH - Eurospeech 2001
An account is given of the evolution and use of the “minimum-linewidth method” for assessing competing integrated circuit technologies, beginning with its use in evaluating thin magnetic-film memory devices in the early 1960s and ending with its use in assessing Josephson-junction devices some twenty years later. From this account, general rules are derived for conducting successful technology assessments. © 1985 IEEE
Robert E. Donovan
INTERSPEECH - Eurospeech 2001
Qing Li, Zhigang Deng, et al.
IEEE T-MI
Sabine Deligne, Ellen Eide, et al.
INTERSPEECH - Eurospeech 2001
Israel Cidon, Leonidas Georgiadis, et al.
IEEE/ACM Transactions on Networking