Microscopy and Microanalysis

Paper

21 Jul 2003

TEM and atom probe microscopy in the development of magnetic multilayer nano-structures

Abstract

No abstract available.

Related

Conference paper

Processing and modeling options for advanced thin film magnetoresistive head structures

Paper

Exchange-biased magnetic tunnel junctions: Dependence of offset field on junction width

Paper

Nanoscale phase separation in Fe₃O₄(111) films on sapphire(0001) and phase stability of Fe₃O₄(001) films on MgO(001) grown by oxygen-plasma-assisted molecular beam epitaxy

Paper

Simultaneous high-speed DualEELS and EDS acquisition at atomic level

View all publications