Joerg Appenzeller, R. Martel, et al.
IEEE Electron Device Letters
Paper
TEM and atom probe microscopy in the development of magnetic multilayer nano-structures
Abstract
No abstract available.
Related
T. Rajagopalan, B. Lahlouh, et al.
Applied Physics Letters
S. Maat, M.J. Carey, et al.
Applied Physics Letters
K.-S. Moon, R.E. Fontana Jr., et al.
Applied Physics Letters