Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
In situ evaporated polycrystalline Yb films at different substrate temperatures (10<T<∼300 K) were studied by surface-sensitive photoemission (h =40.8 eV). The presence of substrcture in the surface-derived 4f13 components allowed an identification of multiple surface shifts as being due to different coordination numbers of surface atoms. The temperature- dependent intensity variation of the surface emission could be correlated with the temperature-dependent change of the surface microstructure. © 1983 The American Physical Society.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Frank Stem
C R C Critical Reviews in Solid State Sciences
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT