Y.Y. Li, K.S. Leung, et al.
J Combin Optim
No abstract available.
Y.Y. Li, K.S. Leung, et al.
J Combin Optim
Harpreet S. Sawhney
IS&T/SPIE Electronic Imaging 1994
Michael E. Henderson
International Journal of Bifurcation and Chaos in Applied Sciences and Engineering
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007