Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
In this paper we address the L∞ Voronoi diagram of polygonal objects and present applications in VLSI layout and manufacturing. We show that the L∞ Voronoi diagram of polygonal objects consists of straight line segments and thus it is much simpler to compute than its Euclidean counterpart; the degree of the computation is significantly lower. Moreover, it has a natural interpretation. In applications where Euclidean precision is not essential the L∞ Voronoi diagram can provide a better alternative. Using the L∞ Voronoi diagram of polygons we address the problem of calculating the critical area for shorts in a VLSI layout. The critical area computation is the main computational bottleneck in VLSI yield prediction.
Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
M. Tismenetsky
International Journal of Computer Mathematics
Y.Y. Li, K.S. Leung, et al.
J Combin Optim
Igor Devetak, Andreas Winter
ISIT 2003