Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
We explore the thickness-dependent optical properties of single layer polymer light emitting diodes for two materials, poly[2-methoxy-5-(2-ethylhexyloxy)-1,4-phenylene-ethenylene-2,5-dioctyloxy-1,4-phenylene-ethenylene] (MEH-DOO-PPV) and poly(2,7-(9,9-bis(2-ethylhexyl))fluorene)-2,7-bis(4-methylphenyl)phenylamine (PF with 2% endcap). We compare experimental electroluminescence spectra and radiance values as a function of emissive layer thickness with simulations utilizing dipole methods within a transfer-matrix formalism. The technique is then extended to explore how simulated results depend on the assumed location of emission within the polymer layer. We show that thickness-dependent optical properties of these devices are dominated by interference effects. © 2003 The American Physical Society.
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
J.C. Marinace
JES
Eloisa Bentivegna
Big Data 2022